June 9, 2019
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Article

Self-validating technique for the measurement of the linewidth enhancement factor in semiconductor lasers

Publicated to: OPTICS EXPRESS. 20 (5): 4979-4987 - 2012-02-27 20(5), DOI: 10.1364/OE.20.004979

Authors:

Consoli, A; Bonilla, B; Tijero, JMG; Esquivias, I
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Affiliations

Univ Politecn Madrid, Dept Tecnol Foton, ETSI Telecomunicac, E-28040 Madrid, Spain - Author

Abstract

A new method for measuring the linewidth enhancement factor (alpha-parameter) of semiconductor lasers is proposed and discussed. The method itself provides an estimation of the measurement error, thus self-validating the entire procedure. The alpha-parameter is obtained from the temporal profile and the instantaneous frequency (chirp) of the pulses generated by gain switching. The time resolved chirp is measured with a polarization based optical differentiator. The accuracy of the obtained values of the alpha-parameter is estimated from the comparison between the directly measured pulse spectrum and the spectrum reconstructed from the chirp and the temporal profile of the pulse. The method is applied to a VCSEL and to a DFB laser emitting around 1550 nm at different temperatures, obtaining a measurement error lower than +/- 8%. (C) 2012 Optical Society of America
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Keywords

AlphaBroadening factorChirp parameterDifferentiationEquipment designEquipment failure analysisInjection-lasersLasers, semiconductorPulsesSurface-emitting laser

Quality index

Bibliometric impact. Analysis of the contribution and dissemination channel

The work has been published in the journal OPTICS EXPRESS due to its progression and the good impact it has achieved in recent years, according to the agency WoS (JCR), it has become a reference in its field. In the year of publication of the work, 2012, it was in position 5/80, thus managing to position itself as a Q1 (Primer Cuartil), in the category Optics.

Independientemente del impacto esperado determinado por el canal de difusión, es importante destacar el impacto real observado de la propia aportación.

Según las diferentes agencias de indexación, el número de citas acumuladas por esta publicación hasta la fecha 2026-04-24:

  • Google Scholar: 13
  • WoS: 8
  • Scopus: 9
  • Europe PMC: 2
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Impact and social visibility

From the perspective of influence or social adoption, and based on metrics associated with mentions and interactions provided by agencies specializing in calculating the so-called "Alternative or Social Metrics," we can highlight as of 2026-04-24:

  • The use of this contribution in bookmarks, code forks, additions to favorite lists for recurrent reading, as well as general views, indicates that someone is using the publication as a basis for their current work. This may be a notable indicator of future more formal and academic citations. This claim is supported by the result of the "Capture" indicator, which yields a total of: 18 (PlumX).

It is essential to present evidence supporting full alignment with institutional principles and guidelines on Open Science and the Conservation and Dissemination of Intellectual Heritage. A clear example of this is:

  • The work has been submitted to a journal whose editorial policy allows open Open Access publication.
  • Assignment of a Handle/URN as an identifier within the deposit in the Institutional Repository: https://oa.upm.es/12166/

As a result of the publication of the work in the institutional repository, statistical usage data has been obtained that reflects its impact. In terms of dissemination, we can state that, as of

  • Views: 374
  • Downloads: 438
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Leadership analysis of institutional authors

There is a significant leadership presence as some of the institution’s authors appear as the first or last signer, detailed as follows: First Author (Consoli, Antonio) and Last Author (ESQUIVIAS MOSCARDO, IGNACIO).

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Awards linked to the item

This work was supported by the Ministerio de Ciencia e Innovacion of Spain under project TEC2009-14581. The authors acknowledge Salvador Balle (Universitat Illes Ballears, Spain) for helpful discussions on how to estimate the alpha-parameter from TRC measurements.
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